Stylus Profilometer DektakXT
The DektakXT stylus profiler features a
revolutionary design that enables unmatched repeatability of 4Å and up to 40%
improved scanning speeds. This major milestone combined with its other
breakthroughs, uniquely enable the DektakXT to perform the critical
nanometer-level film, step and surface measurements needed to power future
advances in the microelectronics, semiconductor, solar, high-brightness LED,
medical, scientific and materials science markets.
performance and better than 4Å repeatability
- The Dektak XT features an innovative single-arch
design that delivers breakthrough platform stability. This is combined with
leading-edge "smart electronics" that establish a new low-noise
benchmark for stylus profiling. Finally, the Dektak XT’s new hardware
configuration offers 40% shorter collection times than prior generations.
efficiency and ease of use
- The Dektak XT is equipped with DIDAC intuitive user
interface, which simplifies workflow and operation to make the profiler easier
than ever to use for advanced analysis. In addition, the system’s self-aligning
styli enables effortless tip exchange, while the profiler’s single sensor
design enables the widest range of capabilities in a single platform.
value from the world leader in stylus profilers
- In addition to premier performance in an affordable
package, the Dektak XT is available with the full complement of accessories to
extend versatility and tailor the system to your specific application.