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Benchtop Stylus Profilometer DektakXT

Benchtop Stylus Profilometer DektakXT

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Benchtop Stylus Profilometer DektakXT

The DektakXT stylus profiler features a revolutionary design that enables unmatched repeatability of 4Å and up to 40% improved scanning speeds. This major milestone combined with its other breakthroughs, uniquely enable the DektakXT to perform the critical nanometer-level film, step and surface measurements needed to power future advances in the microelectronics, semiconductor, solar, high-brightness LED, medical, scientific and materials science markets.

Technical Detail:

1. Unmatched performance and better than 4Å repeatability

  • The Dektak XT features an innovative single-arch design that delivers breakthrough platform stability. This is combined with leading-edge "smart electronics" that establish a new low-noise benchmark for stylus profiling. Finally, the Dektak XT’s new hardware configuration offers 40% shorter collection times than prior generations.

2. Unprecedented efficiency and ease of use

  • The Dektak XT is equipped with DIDAC intuitive user interface, which simplifies workflow and operation to make the profiler easier than ever to use for advanced analysis. In addition, the system’s self-aligning styli enables effortless tip exchange, while the profiler’s single sensor design enables the widest range of capabilities in a single platform.

3. Incomparable value from the world leader in stylus profilers

  • In addition to premier performance in an affordable package, the Dektak XT is available with the full complement of accessories to extend versatility and tailor the system to your specific application.