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X Ray Metrology JV QCVelox

X Ray Metrology JV QCVelox

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X Ray Metrology JV QCVelox

The JV-QCVelox is the system of choice for leading LED manufacturers to monitor their LED production lines. It is based on the industry standard JV-QC3, with significant upgrades for throughput. By using optimum X-ray source and optics technology, it couples high throughput with excellent repeatability to enables fast feedback of the layer quality and structure within a production environment.

Like the JV-QC3, the JV-QCVelox offers true automated operation, with straight-forward horizontal sample mounting, and fully automated alignment, measurements including full mapping without edge exclusion, and  automated data analysis. In addition to the JV-QC3, it includes higher throughput and a barcode reader to aid productivity within a production environment.